SURFCOM NEX

Profile Detection for Every Application

Full flexibility for your application

The contour and surface measuring machines from ZEISS offer different, sometimes combinable sensors for roughness measurements, contour measurements or both.

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Full flexibility for your application

The contour and surface measuring machines from ZEISS offer different, sometimes combinable sensors for roughness measurements, contour measurements or both.

Overview
Options
Technical Data

Overview

SURFCOM NEX Series

Features

futureproff

Future-proof flexibility

  • With two different sizes of granite measuring table and three different sizes of columns to choose from, ZEISS offers a wide range of solutions for various applications.
  • Future-proof thanks to multi-sensor capability with optical and tactile sensors.
  • All tactile styli are exchangeable without tools or screws.
solutions

Furniture solutions

Different furniture choices complete the SURFCOM NEX Series:

  • Space-saving DX variation suitable for production
  • Solid, attractively-priced FX version with integrated active vibration damping or comprehensive SD desk furniture
optional features

Optional features

  • The optional CNC kit, consisting of linear and rotary positioning axis, allows higher productivity due to fully automatic measurements.
  • Optional topography measurements (optical or contact)

Patented magnetic linear drive for higher efficiency

The patented contact-free magnetic linear drive makes SURFCOM NEX highly efficient and low-maintenance. It enables a positioning speed that is up to seven times faster.

Options

The SURFCOM NEX series offers wide range of solutions. In this way we provide the best solution for your application.

su2

SURFCOM NEX 001

  • Best-in-class residual noise (Rz 0) thanks to a low-vibration linear drive
  • Resolution of up to 0.1 nm at a 6.4 µm range and 20 nm at a 1,000 µm range
  • With the optional tracing driver tilting unit it is possible to manually tilt the tracing driver +/-5 degrees
su3

SURFCOM NEX 030

  • Efficient contour measurements with collision protection as a standard feature
  • Standard styli up to 529 mm – for measurements on deep features
  • With the optional tracing driver tilting unit it is possible to manually tilt the tracing driver +/-15 degrees
su4

SURFCOM NEX 040

  • High-precision contour measuring station
  • CNC measuring station with increased accuracy and automated probing force configuration
  • Standard styli up to 529 mm – for measurements on deep features
  • With the optional tracing driver tilting unit it is possible to manually tilt the tracing driver +/-15 degrees
su5

SURFCOM NEX 031

  • Combined roughness and contour measuring station
  • Combines the advantages of the SURFCOM NEX 001 and SURFCOM NEX 031
su6

SURFCOM NEX 041

  • Combined CNC measuring station with increased precision
  • Combines the advantages of the SURFCOM NEX 001 and SURFCOM NEX 041
su7

SURFCOM NEX 100

  • Universal hybrid measuring station
  • The highly precise dual probe enables roughness and contour measurements in one run without exchanging the sensor
su8

SURFCOM NEX with white light sensor

  • Optical sensor for roughness measurements
  • The SURFCOM NEX with white light sensor uses light to perform non-contact measurements, making the measuring machine especially suitable for sensitive surfaces

Technical Data for SURFCOM NEX

X/C

Measuring range Z for roughness

Resolution roughness

Accuracy Z

Straightness X

100/250

max. 1000µm

min. 0.1nm

+/- 2% on 20µm periode

0.05+L/1000µm

200/250

max. 1000µm

min. 0.1nm

+/- 2% on 20µm periode

0.05+L/1000µm

100/450

max. 1000µm

min. 0.1nm

+/- 2% on 20µm periode

0.05+L/1000µm

200/450

max. 1000µm

min. 0.1nm

+/- 2% on 20µm periode

0.05+L/1000µm

100/650

max. 1000µm

min. 0.1nm

+/- 2% on 20µm periode

0.05+L/1000µm

200/650

max. 1000µm

min. 0.1nm

+/- 2% on 20µm periode

0.05+L/1000µm

Optional: Measuring range Z for contour with standard stylus

X/C

Measuring range Z for contour

Resolution contour

Accuracy Z

Straightness X

100/250

60mm

0.04µm

+/-(1.5+[2H]/100)µm

1µm/100mm

200/250

60mm

0.04µm

+/-(1.5+[2H]/100)µm

1µm/100mm

100/450

60mm

0.04µm

+/-(1.5+[2H]/100)µm

1µm/100mm

200/450

60mm

0.04µm

+/-(1.5+[2H]/100)µm

1µm/100mm

100/650

60mm

0.04µm

+/-(1.5+[2H]/100)µm

1µm/100mm

200/650

60mm

0.04µm

+/-(1.5+[2H]/100)µm

1µm/100mm

Optional: Measuring range Z for roughness with standard stylus

X/C

Measuring range Z for contour

Resolution contour

Accuracy Z

Straightness X

100/250

60mm

0.02µm

+/-(0.8+[2H]/100)µm

1µm/100mm

200/250

60mm

0.02µm

+/-(0.8+[2H]/100)µm

1µm/100mm

100/450

60mm

0.02µm

+/-(0.8+[2H]/100)µm

1µm/100mm

200/450

60mm

0.02µm

+/-(0.8+[2H]/100)µm

1µm/100mm

100/650

60mm

0.02µm

+/-(0.8+[2H]/100)µm

1µm/100mm

200/650

60mm

0.02µm

+/-(0.8+[2H]/100)µm

1µm/100mm

Optional: Measuring range Z for roughness with standard stylus

X/C

Measuring range Z for roughness

Measuring range Z for contour

Resolution roughness

Resolution contour

Accuracy Z

Straightness X

100/250

max. 1000µm

60mm

min. 0.1nm

0.04µm

+/-(1.5+[2H]/100)µm

0.05+L/1000µm

200/250

max. 1000µm

60mm

min. 0.1nm

0.04µm

+/-(1.5+[2H]/100)µm

0.05+L/1000µm

100/450

max. 1000µm

60mm

min. 0.1nm

0.04µm

+/-(1.5+[2H]/100)µm

0.05+L/1000µm

200/450

max. 1000µm

60mm

min. 0.1nm

0.04µm

+/-(1.5+[2H]/100)µm

0.05+L/1000µm

100/650

max. 1000µm

60mm

min. 0.1nm

0.04µm

+/-(1.5+[2H]/100)µm

0.05+L/1000µm

200/650

max. 1000µm

60mm

min. 0.1nm

0.04µm

+/-(1.5+[2H]/100)µm

0.05+L/1000µm

X/C

Measuring range Z for roughness

Measuring range Z for contour

Resolution roughness

Resolution contour

Accuracy Z

Straightness X

100/250

max. 1000µm

60mm

min. 0.1nm

0.02µm

+/-(0.8+[2H]/100)µm

0.05+L/1000µm

200/250

max. 1000µm

60mm

min. 0.1nm

0.02µm

+/-(0.8+[2H]/100)µm

0.05+L/1000µm

100/450

max. 1000µm

60mm

min. 0.1nm

0.02µm

+/-(0.8+[2H]/100)µm

0.05+L/1000µm

200/450

max. 1000µm

60mm

min. 0.1nm

0.02µm

+/-(0.8+[2H]/100)µm

0.05+L/1000µm

100/650

max. 1000µm

60mm

min. 0.1nm

0.02µm

+/-(0.8+[2H]/100)µm

0.05+L/1000µm

200/650

max. 1000µm

60mm

min. 0.1nm

0.02µm

+/-(0.8+[2H]/100)µm

0.05+L/1000µm

X/C

Measuring range Z for roughness and contour

Resolution roughness and contour

Resolution only contour

Accuracy Z

Straightness X

100/250

5mm

min. 0.1nm

0.1µm

+/-(1.0+[2H]/100)µm

0.05+L/1000µm

200/250

5mm

min. 0.1nm

0.1µm

+/-(1.0+[2H]/100)µm

0.05+L/1000µm

100/450

5mm

min. 0.1nm

0.1µm

+/-(1.0+[2H]/100)µm

0.05+L/1000µm

200/450

5mm

min. 0.1nm

0.1µm

+/-(1.0+[2H]/100)µm

0.05+L/1000µm

100/650

5mm

min. 0.1nm

0.1µm

+/-(1.0+[2H]/100)µm

0.05+L/1000µm

200/650

5mm

min. 0.1nm

0.1µm

+/-(1.0+[2H]/100)µm

0.05+L/1000µm

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+91-98188 13364

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G – 22, Palam Ext., Sector – 7,
Dwarka, New Delhi – 110075

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+91-98188 13364

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